Journal article
Imaging and Tracking Through Scattering Medium With Low Bit Depth Speckle
Abstract
Authors
Xu Q; Sun B; Zhao J; Wang Z; Du L; Sun C; Li X; Li X
Journal
IEEE Photonics Journal, Vol. 12, No. 2, pp. 1–7
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
April 1, 2020
DOI
10.1109/jphot.2020.2974898
ISSN
1943-0647