Nanoanalytical quantification of the nitrogen content in Ga(NAs)∕GaAs by using transmission electron microscopy in combination with refined structure factor calculation Academic Article uri icon

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authors

  • Volz, K
  • Rubel, Oleg
  • Torunski, T
  • Baranovskii, SD
  • Stolz, W

publication date

  • February 20, 2006