Transport and Structural Properties of VO2 Films Journal Articles

abstract

• Transport properties of sputtered VO2 films are shown to be critically dependent on the defect structure of this material. Measured values of thermoelectric power and Hall mobility for films deposited under optimum conditions are comparable to those previously measured on single crystals.

authors

• Kwan, Clarence C Y
• Griffiths, CH
• Eastwood, HK

status

• published 

publication date

• 1972

has subject area

• 02 Physical Sciences (FoR)
• 09 Engineering (FoR)
• 10 Technology (FoR)
• Applied Physics (Science Metrix)

published in

• Applied Physics Letters  Journal

keywords

• 51 Physical Sciences
• 5104 Condensed Matter Physics

Digital Object Identifier (DOI)

• 10.1063/1.1654062

start page

• 93

end page

• 95

volume

• 20

issue

• 2