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Power-Constrained Testing of VLSI Circuits
Journal article
Power-Constrained Testing of VLSI Circuits
Authors
Nicolici N; Al-Hashimi B
Journal
, , ,
Publication Date
January 1, 2004
Associated Experts
Nicola Nicolici
Professor, Faculty of Engineering
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Labels
Fields of Research (FoR)
40 Engineering
4008 Electrical Engineering
4009 Electronics, Sensors and Digital Hardware
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