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Test cost reduction through compression
Journal Articles
Overview
Identity
Additional Document Info
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Overview
authors
Gonciari, P
Nicolici, Nicola
Al-Hashimi, B
status
published
publication date
June 1, 2003
published in
IEE Electronics Systems and Software
Journal
Identity
Digital Object Identifier (DOI)
10.1049/ess:20030307
Additional Document Info
start page
37
end page
41
volume
1
issue
3