Journal article
Test cost reduction through compression
Authors
Gonciari P; Nicolici N; Al-Hashimi B
Journal
Electronic Systems and Software, Vol. 1, No. 3, pp. 37–41
Publisher
Institution of Engineering and Technology (IET)
Publication Date
June 1, 2003
DOI
10.1049/ess:20030307
ISSN
1479-8336