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Lamination Method for the Study of Interfaces in...
Journal article

Lamination Method for the Study of Interfaces in Polymeric Thin Film Transistors

Abstract

A method for the fabrication of polymeric thin-film transistors (TFTs) by lamination is described. Poly(dimethylsiloxane) stamps were used to delaminate thin films of semiconducting polymers from silicon wafers coated with a self-assembled monolayer (SAM) formed from octyltrichlorosilane. These supported films were laminated onto electrode structures to form coplanar TFTs. The fabrication process was used to make TFTs with …

Authors

Chabinyc ML; Salleo A; Wu Y; Liu P; Ong BS; Heeney M; McCulloch I

Journal

Journal of the American Chemical Society, Vol. 126, No. 43, pp. 13928–13929

Publisher

American Chemical Society (ACS)

Publication Date

November 1, 2004

DOI

10.1021/ja044884o

ISSN

0002-7863