Journal article
ITS, eh! Meet Canada's flagship ITS centre and testbed
Abstract
Authors
Abdulhai B
Journal
IEEE Intelligent Systems, Vol. 18, No. 1, pp. 86–89
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2003
DOI
10.1109/mis.2003.1179198
ISSN
1541-1672