Characterization of X‑ray Damage to Perfluorosulfonic Acid Using Correlative Microscopy

Polymer electrolytes such as perfluorosulfonic acid (PFSA) are key to a variety of electrochemical and clean energy applications. Many analytical techniques for characterizing nanostructured devices containing polymer electrolytes use high-energy electrons or X-rays, which can severely damage soft matter. To better analyze these materials, it is important to understand the chemical, physical, and spectroscopic changes that occur due to …