authors Mahtab, Mahsa Synowicki, Ron Bahrami-Yekta, Vahid Bannow, Lars C Koch, Stephan W Lewis, Ryan Tiedje, Thomas
keywords BAND-GAP BISMUTH CRITICAL-POINT PARAMETERS DEPENDENCE DIFFERENTIATION ELECTRONIC-PROPERTIES ENERGY GAAS Materials Science Materials Science, Multidisciplinary SEMICONDUCTORS Science & Technology Technology