Journal article
A simple calibration for routine section thickness measurements using current density ratios
Abstract
A method to calibrate current density ratios for the determination of specimen thickness is presented. This method uses a tilt series from a single noncrystalline specimen to create different thicknesses; these are used to generate data points to establish the relationship between specimen thickness and current density ratio. The actual specimen thickness at 0° tilt was determined to an accuracy of 5 nm by a parallax method. From the …
Authors
HENG YM; OTTENSMEYER FP; ARSENAULT AL; SIMON GT
Journal
Journal of Microscopy, Vol. 173, No. 1, pp. 79–82
Publisher
Wiley
Publication Date
January 1994
DOI
10.1111/j.1365-2818.1994.tb03430.x
ISSN
0022-2720