Recent Advances in the Application of Slow Positron Beams to the Study of Ion Implantation Defects in Silicon
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Overview
publication date
- January 1, 2000
has subject area
- 0204 Condensed Matter Physics (FoR)
- 0306 Physical Chemistry (incl. Structural) (FoR)
- 0912 Materials Engineering (FoR)
- Materials (Science Metrix)
published in
- Defect and Diffusion Forum Journal