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Quasi-Steady-State Free Carrier Absorption...
Journal article

Quasi-Steady-State Free Carrier Absorption Measurements of Effective Carrier Lifetime in Silicon

Abstract

The paper presents a semiconductor carrier lifetime measurement technique, quasi-steady-state free carrier absorption (QSS-FCA), that is an all-optical analog of the quasi-steady-state photoconductivity technique. The effective electronhole recombination lifetime of silicon is measured under quasi-steady-state conditions using an above-bandgap pump and a below-bandgap probe of the free carrier absorption (FCA). A mathematical model is developed …

Authors

Boyd KMW; Kleiman RN

Journal

IEEE Journal of Photovoltaics, Vol. 9, No. 1, pp. 64–71

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

DOI

10.1109/jphotov.2018.2874973

ISSN

2156-3381