High-Q tellurium-oxide-coated silicon nitride microring resonators Journal Articles uri icon

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  • We report on tellurium-oxide (TeO2)-coated silicon nitride microring resonators with internal quality factors up to 7.3×105, corresponding to 0.5 dB/cm waveguide loss, at wavelengths around 1550 nm. The microring resonators are fabricated using a silicon nitride foundry process followed by TeO2 coating deposition in a single post-processing step. The silicon nitride strip height of 0.2 μm enables a small microring bending radius, while the TeO2 coating thickness of 0.33 μm results in a large modal overlap with the TeO2 layer. These results are a promising step towards realizing compact and high-performance linear, nonlinear, and rare-earth-doped active integrated photonic devices with this platform.


  • Frankis, Henry C
  • Kiani, Khadijeh Miarabbas
  • Su, Daniel
  • Mateman, Richard
  • Leinse, Arne
  • Bradley, Jonathan

publication date

  • January 1, 2019