Journal article
Bad data injection in smart grid: attack and defense mechanisms
Abstract
Authors
Huang Y; Esmalifalak M; Nguyen H; Zheng R; Han Z; Li H; Song L
Journal
IEEE Communications Magazine, Vol. 51, No. 1, pp. 27–33
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 16, 2013
DOI
10.1109/mcom.2013.6400435
ISSN
0163-6804