Journal article
Impurity bands in moderately doped semiconductors and their effect on the MOS C-V freeze-out characteristics H. D. Barber, K. C. Lee and J. Erle Jones Solid-State Electronics, 19, p.365 (1976)
Journal
Microelectronics Journal, Vol. 10, No. 1,
Publisher
Elsevier
Publication Date
May 1979
DOI
10.1016/s0026-2692(79)80123-8
ISSN
0026-2692