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Impurity bands in moderately doped semiconductors and their effect on the MOS C-V freeze-out characteristics
Journal Articles
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Additional Document Info
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Overview
authors
Barber, Douglas
status
published
publication date
May 1979
published in
MICROELECTRONICS JOURNAL
Journal
Research
keywords
40 Engineering
4009 Electronics, Sensors and Digital Hardware
Identity
Digital Object Identifier (DOI)
10.1016/s0026-2692(79)80123-8
Additional Document Info
start page
66
end page
66
volume
10
issue
1