Effect of UV radiation damage in air on polymer film thickness, studied by soft X-ray spectromicroscopy Academic Article uri icon

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abstract

  • The thicknesses of thin films of polystyrene (PS), poly(methyl methacrylate) (PMMA), and perfluorosulfonic acid (PFSA) were measured by Ultraviolet Spectral Reflectance (UV-SR) and Scanning Transmission X-ray Microscopy (STXM).

publication date

  • June 20, 2018