Journal article
Direct Deembedding of Noise Factors for On-Wafer Noise Measurement
Abstract
This paper extends the noise theory of linear networks to enable direct deembedding of noise factors for an active device surrounded by a passive four-port. It solves the problem of noise factor deembedding, when there are feedback paths between the output and input of a device-under-test. It also leads to a new approach to obtain intrinsic noise parameters for on-wafer noise measurements by performing deembedding first and optimization last. …
Authors
Chen X; Chen C-H; Lee R; Chen DC; Wu DY
Journal
IEEE Transactions on Microwave Theory and Techniques, Vol. 65, No. 3, pp. 916–922
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2017
DOI
10.1109/tmtt.2016.2627555
ISSN
0018-9480