Journal article
Bit-Flip Detection-Driven Selection of Trace Signals
Authors
Vali A; Nicolici N
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 37, No. 5, pp. 1076–1089
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
May 1, 2018
DOI
10.1109/tcad.2017.2729458
ISSN
0278-0070