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Control of GaP nanowire morphology by group V flux...
Journal article

Control of GaP nanowire morphology by group V flux in gas source molecular beam epitaxy

Abstract

GaP nanowires (NWs) were grown on a Si substrate by gas source molecular beam epitaxy using self-assisted growth. Selective-area growth was achieved using a patterned oxide mask. Periodic GaAsP marker layers were introduced during growth to study the growth progression using transmission electron microscopy. We demonstrate control of the NW morphology via the V/III flux ratio, the pattern pitch, and the oxide hole diameter. As the V/III flux …

Authors

Kuyanov P; Boulanger J; LaPierre RR

Journal

Journal of Crystal Growth, Vol. 462, , pp. 29–34

Publisher

Elsevier

Publication Date

March 2017

DOI

10.1016/j.jcrysgro.2017.01.025

ISSN

0022-0248