Effect of Process Parameter Variability on the Threshold Voltage of Downscaled 22nm PMOS using Taguchi Method Conference Paper uri icon

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authors

  • Menon, Suresh
  • Maheran, Afifah AH
  • Menon, PS
  • Shaari, S
  • Kalaivani, T
  • Ahmad, I
  • Faizah, Noor ZA
  • Apte, PR

publication date

  • January 1, 2014