Statistical Process Modelling For 32nm High-K/Metal Gate PMOS Device Conference Paper uri icon

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authors

  • Menon, Suresh
  • Maheran, Afifah AH
  • Faizah, Noor ZA
  • Menon, PS
  • Ahmad, I
  • Apte, PR
  • Kalaivani, T
  • Salehuddin, F

publication date

  • January 1, 2014