Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−<i>δ</i> thin films

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity.

Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films Journal Articles