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A phenomenological description for chemically...
Journal article

A phenomenological description for chemically induced grain boundary migration

Abstract

The phenomenology of chemically induced grain boundary migration (CIGM) is described in a model which allows the computation of the speed of the moving grain boundary, and of the diffusion field, in a self-consistent way. Special emphasis is given to the problem of a threshold for migration, and to the question of the shape of the moving grain boundary.

Authors

Brechet YJM; Purdy GR

Journal

Acta Metallurgica, Vol. 37, No. 8, pp. 2253–2259

Publisher

Elsevier

Publication Date

8 1989

DOI

10.1016/0001-6160(89)90152-1

ISSN

0001-6160