Journal article
Full Vectorial 3-D Sensitivity Analysis and Design Optimization Using BPM
Abstract
Authors
Swillam MA; Bakr MH; Li X
Journal
Journal of Lightwave Technology, Vol. 26, No. 5, pp. 528–536
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
March 1, 2008
DOI
10.1109/jlt.2007.916496
ISSN
0733-8724