Journal article
Sub-ångstrom Experimental Validation of Molecular Dynamics for Predictive Modeling of Extended Defect Structures in Si
Abstract
In this Letter we present the detailed, quantitative comparison between experimentally and theoretically derived structures of the extended {311} defect in silicon. Agreement between experimental and theoretical column positions of better than ±0.05 nm has been achieved for all 100 atomic columns in the defect structure. This represents a calculated density of 5.5×10(14) silicon interstitials per cm(2) on {311} planes, in agreement with …
Authors
Dudeck KJ; Marqués LA; Knights AP; Gwilliam RM; Botton GA
Journal
Physical Review Letters, Vol. 110, No. 16,
Publisher
American Physical Society (APS)
Publication Date
April 19, 2013
DOI
10.1103/physrevlett.110.166102
ISSN
0031-9007