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Sub-ångstrom Experimental Validation of Molecular...
Journal article

Sub-ångstrom Experimental Validation of Molecular Dynamics for Predictive Modeling of Extended Defect Structures in Si

Abstract

In this Letter we present the detailed, quantitative comparison between experimentally and theoretically derived structures of the extended {311} defect in silicon. Agreement between experimental and theoretical column positions of better than ±0.05 nm has been achieved for all 100 atomic columns in the defect structure. This represents a calculated density of 5.5×10(14) silicon interstitials per cm(2) on {311} planes, in agreement with …

Authors

Dudeck KJ; Marqués LA; Knights AP; Gwilliam RM; Botton GA

Journal

Physical Review Letters, Vol. 110, No. 16,

Publisher

American Physical Society (APS)

Publication Date

April 19, 2013

DOI

10.1103/physrevlett.110.166102

ISSN

0031-9007