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Ambient Temperature Ultrasonic Bonding of Si-Dice...
Journal article

Ambient Temperature Ultrasonic Bonding of Si-Dice Using Sn-3.5wt.%Ag

Abstract

Ultrasonic bonding of Si-dice to type FR-4 printed circuit boards (PCB) with Sn-3.5wt.%Ag solder at ambient temperature was investigated. The under-bump metallization (UBM) on the Si-dice comprised Cu/Ni/Al from top to bottom with thicknesses of 0.4 μm, 0.4 μm, and 0.3 μm, respectively. The pads on the PCBs consisted of Au/Ni/Cu with thicknesses of 0.05/5/18 μm, sequentially from top to bottom. Solder was supplied as Sn-3.5wt.%Ag foil rolled to …

Authors

Kim J-M; Jung J-P; Zhou YN; Kim J-Y

Journal

Journal of Electronic Materials, Vol. 37, No. 3, pp. 324–330

Publisher

Springer Nature

Publication Date

3 2008

DOI

10.1007/s11664-007-0341-z

ISSN

0361-5235