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Recover the phases from intensity data of x-ray...
Journal article

Recover the phases from intensity data of x-ray diffraction

Abstract

For many years, people believed that in conventional x-ray crystallography one can only record the scattering intensities but not the phases. In order to study structures at the atomic scale, one has to use multibeam measurement or to rely on additional knowledge such as bonding length and to fit the intensity data by trial structure models. In this letter, however, we show that the phases are in fact hidden in the intensity data and can be …

Authors

Xu G

Journal

Applied Physics Letters, Vol. 73, No. 7, pp. 909–911

Publisher

AIP Publishing

Publication Date

August 17, 1998

DOI

10.1063/1.122034

ISSN

0003-6951

Labels

Fields of Research (FoR)