Journal article
Recover the phases from intensity data of x-ray diffraction
Abstract
For many years, people believed that in conventional x-ray crystallography one can only record the scattering intensities but not the phases. In order to study structures at the atomic scale, one has to use multibeam measurement or to rely on additional knowledge such as bonding length and to fit the intensity data by trial structure models. In this letter, however, we show that the phases are in fact hidden in the intensity data and can be …
Authors
Xu G
Journal
Applied Physics Letters, Vol. 73, No. 7, pp. 909–911
Publisher
AIP Publishing
Publication Date
August 17, 1998
DOI
10.1063/1.122034
ISSN
0003-6951