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Atomic resolution x-ray hologram
Journal article

Atomic resolution x-ray hologram

Abstract

Unlike crystals producing sharp peaks under the x-ray diffraction, disordered materials show slowly varying patterns presenting little structural information. This is due to the fact that only the scattering intensity can be recorded, and the loss of the phase information makes the Fourier inversion of the amplitude impossible. However, when an amorphous sample is placed on a crystal, the x-ray intensity diffracted by the assembly can produce a …

Authors

Xu G

Journal

Applied Physics Letters, Vol. 68, No. 14, pp. 1901–1903

Publisher

AIP Publishing

Publication Date

April 1, 1996

DOI

10.1063/1.116288

ISSN

0003-6951

Labels

Fields of Research (FoR)