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Scholarly Works

Analysing trade-offs in scan power and test data...

Journal article

Analysing trade-offs in scan power and test data compression for systems-on-a-chip

Authors

Rosinger PM; Gonciari PT; Al-Hashimi BM; Nicolici N

Journal

IET Computers & Digital Techniques, Vol. 149, No. 4,

Publisher

Institution of Engineering and Technology (IET)

Publication Date

2002

DOI

10.1049/ip-cdt:20020450

ISSN

1751-8601

Associated Experts

Nicola Nicolici

Professor, Faculty of Engineering

Labels

Fields of Research (FoR)

4606 Distributed computing and systems software 46 Information and Computing Sciences 40 Engineering 4009 Electronics, sensors and digital hardware

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