Automating Data Analysis and Acquisition Setup in a Silicon Debug Environment

With the growing size of modern designs and more strict time-to-market constraints, design errors can unavoidably escape pre-silicon verification and reside in silicon prototypes. Due to those errors and faults in the fabrication process, silicon debug has become a necessary step in the digital integrated circuit design flow. Embedded hardware blocks, such as scan chains and trace buffers, provide a means to acquire data of internal signals in …