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A novel structural singularity in vacuum-deposited...
Journal article

A novel structural singularity in vacuum-deposited thin films: The mechanism of critical optimization of thin film properties

Abstract

A wide range of vacuum-deposited materials (both organic and inorganic) has previously been shown to exhibit sharply optimized properties (including carrier mobility, smoothness, epitaxial order, electrophotographic performance, photovoltaic and photo-e.m.f. effects, and optical properties) when the condensation (substrate) temperatures are held in a very narrow range near 0.33 of the respective normal boiling points. This relationship held for …

Authors

Vincett PS; Popovic ZD; McIntyre L

Journal

Thin Solid Films, Vol. 82, No. 4, pp. 357–376

Publisher

Elsevier

Publication Date

August 1981

DOI

10.1016/0040-6090(81)90479-x

ISSN

0040-6090