Journal article
Synchronization Overhead in SOC Compressed Test
Abstract
Test data compression is an enabling technology for low-cost test. Compression schemes however, require communication between the system under test and the automated test equipment. This communication, referred to in this paper as synchronization overhead, may hinder the effective deployment of this new test technology for core-based systems-on-chip. This paper analyzes the sources of synchronization overhead and discusses the different …
Authors
Gonciari PT; Al-Hashimi B; Nicolici N
Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 13, No. 1, pp. 140–152
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
January 1, 2005
DOI
10.1109/tvlsi.2004.834238
ISSN
1063-8210