Journal article
Wrapper Design for Multifrequency IP Cores
Abstract
This paper addresses the testability problems raised by intellectual property cores with multiple clock domains. The proposed solution is based on a novel core wrapper architecture and a new wrapper design algorithm. It is shown how multifrequency at-speed test response capture can be achieved via the design of capture windows without any structural modifications to the logic within the embedded core. The new features in the core wrapper …
Authors
Xu Q; Nicolici N
Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 13, No. 6, pp. 678–685
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
June 1, 2005
DOI
10.1109/tvlsi.2005.848811
ISSN
1063-8210