Journal article
Guest Editors' Introduction: Top Papers from the 2015 International Test Conference
Authors
Nicolici N; Stratigopoulos H-G
Journal
IEEE Design and Test, Vol. 33, No. 6, pp. 5–6
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
December 1, 2016
DOI
10.1109/mdat.2016.2594440
ISSN
2168-2356