Journal article
Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test
Abstract
Scan chain division has been successfully used to control shift power by enabling mutually exclusive flip-flops at different times during the scan cycle. However, to control capture power without losing transition fault coverage during at-speed scan test, the existing automatic test pattern generation (ATPG) flows need to be modified. In this paper, we present a novel scan chain division algorithm that analyzes the signal dependencies and …
Authors
Ko HF; Nicolici N
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 27, No. 11, pp. 2092–2097
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
November 1, 2008
DOI
10.1109/tcad.2008.2006091
ISSN
0278-0070