Interfacial mixing of ultrathin Cr films grown on an Fe whisker

½-ML Cr films grown on an Fe whisker have been studied using angle-resolved Auger electron forward scattering as a function of the substrate temperature at which the Cr was deposited. The angular scans of the peak-to-peak Cr Auger intensity show pronounced peaks due to forward scattering, which indicate significant intermixing of Cr atoms into the second layer for films grown at 100, 180, and 246°C, and into the third layer for the film grown …