Journal article
Nature of the highly conducting interfacial layer in GaN films
Abstract
Using several scanning probe techniques to investigate local electronic properties, we show that the GaN/sapphire interfacial region contains ⩾ ten times higher electron density but with the Fermi level being 50–100 meV deeper in the band gap compared to the less-conducting bulk film. This anomalous behavior cannot be explained by transport in the intrinsic conduction band of GaN. Rather, it points to the existence of a partially filled donor …
Authors
Hsu JWP; Lang DV; Richter S; Kleiman RN; Sergent AM; Molnar RJ
Journal
Applied Physics Letters, Vol. 77, No. 18, pp. 2873–2875
Publisher
AIP Publishing
Publication Date
October 30, 2000
DOI
10.1063/1.1320853
ISSN
0003-6951