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Nature of the highly conducting interfacial layer...
Journal article

Nature of the highly conducting interfacial layer in GaN films

Abstract

Using several scanning probe techniques to investigate local electronic properties, we show that the GaN/sapphire interfacial region contains ⩾ ten times higher electron density but with the Fermi level being 50–100 meV deeper in the band gap compared to the less-conducting bulk film. This anomalous behavior cannot be explained by transport in the intrinsic conduction band of GaN. Rather, it points to the existence of a partially filled donor …

Authors

Hsu JWP; Lang DV; Richter S; Kleiman RN; Sergent AM; Molnar RJ

Journal

Applied Physics Letters, Vol. 77, No. 18, pp. 2873–2875

Publisher

AIP Publishing

Publication Date

October 30, 2000

DOI

10.1063/1.1320853

ISSN

0003-6951