Journal article
Sensitivity of Microwave Imaging Systems Employing Scattering-Parameter Measurements
Abstract
The physical contrast sensitivity of microwave imaging systems employing scattering-parameter measurements is defined. Methodologies are proposed for its evaluation through measurements and through simulations. This enables the estimation of the smallest detectable target permittivity contrast or size for the system under evaluation. The outcomes of the proposed simulation-based and measurement-based methods are compared for the case of a …
Authors
Moussakhani K; McCombe JJ; Nikolova NK
Journal
IEEE Transactions on Microwave Theory and Techniques, Vol. 62, No. 10, pp. 2447–2455
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 1, 2014
DOI
10.1109/tmtt.2014.2350961
ISSN
0018-9480