Journal article
Sensitivity of Microwave Imaging Systems Employing Scattering-Parameter Measurements
Abstract
Authors
Moussakhani K; McCombe JJ; Nikolova NK
Journal
IEEE Transactions on Microwave Theory and Techniques, Vol. 62, No. 10, pp. 2447–2455
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
October 1, 2014
DOI
10.1109/tmtt.2014.2350961
ISSN
0018-9480