Journal article
X-ray spectromicroscopy of polymers and tribological surfaces at beamline X1A at the NSLS
Abstract
We provide a general overview of microspectroscopy and spectromicroscopy for materials characterization at beamline X1A at the national synchrotron light source (NSLS). Two instruments, the scanning transmission X-ray microscope (STXM) and scanning photoemission microscope (SPEM), are available. The STXM has been able to provide a spatial resolution of better than 50 nm for several years and near edge X-ray absorption fine structure (NEXAFS) …
Authors
Ade H; Smith AP; Zhang H; Zhuang GR; Kirz J; Rightor E; Hitchcock A
Journal
Journal of Electron Spectroscopy and Related Phenomena, Vol. 84, No. 1-3, pp. 53–72
Publisher
Elsevier
Publication Date
March 1997
DOI
10.1016/s0368-2048(97)00013-3
ISSN
0368-2048