EXCESS LOW FREQUENCY NOISE IN SINGLE-WALL CARBON NANOTUBE Academic Article uri icon

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abstract

  • Low frequency noise measurements have been performed on a single-wall carbon nanotube connected by Ti/Au electrodes. It has been found that the 1/f noise decreases when the measurements are undertaken under vacuum and when the nanotube is partially degassed, showing a correlation between the fluctuation inducing the 1/f noise and the presence of gases. We show that the 1/f noise sources are located at the metal/nanotube contacts. When the device is annealed under vacuum at 450K, some Lorentzian shapes are observable and can be related to nanotube defects or to strongly bound molecules.

authors

  • SOLIVERES, S
  • HOFFMANN, A
  • PASCAL, F
  • DELSENY, C
  • KABIR, MS
  • NUR, O
  • SALESSE, A
  • WILLANDER, M
  • Deen, Jamal

publication date

  • March 2006