Evaluation of the charge density in the contact region of organic thin film transistors

This paper presents a procedure to evaluate the charge density in the low conductivity regions between the metal and the accumulated intrinsic channel of an organic thin film transistor (OTFT). This charge links different physical mechanisms in the contacts of OTFTs. The charge density is evaluated in transistors with different metal-organic barriers to study its dependence with the voltage, temperature and the materials forming the contact.