Effects of Gate Oxide and Junction Nonuniformity on the DC and Low-Frequency Noise Performance of Four-Gate Transistors Academic Article uri icon

  •  
  • Overview
  •  
  • Research
  •  
  • Identity
  •  
  • Additional Document Info
  •  
  • View All
  •  

authors

  • Jiménez Tejada, Juan A
  • Rodríguez, A Luque
  • Godoy, A
  • Rodríguez-Bolívar, S
  • López Villanueva, Juan A
  • Marinov, O
  • Deen, Jamal

publication date

  • February 2012