Journal article
Low frequency noise in complementary npn and pnp polysilicon emitter bipolar junction transistors
Abstract
Low frequency noise characteristics of high voltage, high performance complementary polysilicon emitter bipolar transistors are described. The influence of the base biasing resistance, emitter geometry and temperature on the noise spectra are discussed. The npn transistors studied exhibited 1/f and shot noise, but the pnp transistors are characterized by significant generation–recombination noise contributions to the total noise. For both types …
Authors
Deen MJ; Rumyantsev S
Journal
Microelectronics Reliability, Vol. 40, No. 11, pp. 1855–1861
Publisher
Elsevier
Publication Date
November 2000
DOI
10.1016/s0026-2714(00)00090-1
ISSN
0026-2714