Low frequency noise of reverse biased rectifier diodes in the avalanche breakdown regime

A detailed investigation of the low frequency noise in rectifier diodes in the breakdown regime showed that the noise is a nonmonotonic function of the reverse current. A dynamic “competition” between impact ionization and microplasma switching explains the nonmonotonic, repetitive, and correlated variations in the breakdown slope (change in voltage per unit change in current—dV/dI), the noise level, and the noise waveform. These variations are due to the bistable microplasma fluctuation. The theories for avalanche charge multiplication and microplasma fluctuation should be combined with the microplasma switching theory to develop a physical model for the avalanche breakdown.

Low frequency noise of reverse biased rectifier diodes in the avalanche breakdown regime Journal Articles