Effects of body biasing on the low frequency noise of MOSFETs from a 130 nm CMOS technology Academic Article uri icon

  •  
  • Overview
  •  
  • Research
  •  
  • Identity
  •  
  • Additional Document Info
  •  
  • View All
  •  

authors

  • Marin, M
  • Deen, Jamal
  • de Murcia, M
  • Llinares, P
  • Vildeuil, JC

publication date

  • 2004