Journal article
Effects of body biasing on the low frequency noise of MOSFETs from a 130 nm CMOS technology
Authors
Marin M; Deen MJ; de Murcia M; Llinares P; Vildeuil JC
Journal
IEE Proceedings - Circuits Devices and Systems, Vol. 151, No. 2,
Publisher
Institution of Engineering and Technology (IET)
Publication Date
2004
DOI
10.1049/ip-cds:20040509
ISSN
1350-2409