Journal article
Comparison of low-frequency noise in III–V and Si∕SiGe HBTs
Authors
Pascal F; Chay C; Deen MJ; G-Jarrix S; Delseny C; Penarier A
Journal
IEE Proceedings - Circuits Devices and Systems, Vol. 151, No. 2,
Publisher
Institution of Engineering and Technology (IET)
Publication Date
April 1, 2004
DOI
10.1049/ip-cds:20040505
ISSN
1350-2409