Journal article
Accurate Modeling and Parameter Extraction for Meander-Line N-Well Resistors
Abstract
Authors
Murji R; Deen MJ
Journal
IEEE Transactions on Electron Devices, Vol. 52, No. 7, pp. 1364–1369
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date
July 1, 2005
DOI
10.1109/ted.2005.850637
ISSN
0018-9383