Channel noise modeling of deep submicron MOSFETs Journal Articles

authors

• Chen, Chih-hung
• Chih-Hung Chen
• Deen, Jamal

status

• published 

publication date

• August 2002

has subject area

• 0906 Electrical and Electronic Engineering (FoR)
• Applied Physics (Science Metrix)

published in

• IEEE Transactions on Electron Devices  Journal

keywords

• Engineering
• Engineering, Electrical & Electronic
• Physical Sciences
• Physics
• Physics, Applied
• Science & Technology
• THERMAL NOISE
• Technology
• channel length modulation
• channel noise of deep submicron MOSFETs
• diffusion noise
• high-frequency noise modeling
• thermal noise

Digital Object Identifier (DOI)

• 10.1109/ted.2002.801229

start page

• 1484

end page

• 1487

volume

• 49

issue

• 8