Organic Thin-Film Transistors: Part II—Parameter Extraction

A parameter extraction methodology and a verification of a generic analytical model and a thin-film transistor (TFT) compact dc model for the current–voltage characteristics of organic TFTs are presented. The verification shows that the proposed models meet the requirements for compact modeling and for computer circuit simulators. The models are fully symmetrical, and the TFT compact dc model is validated in all regimes of operation—linear and saturation above threshold, subthreshold, and reverse biasing. Suitable characterization techniques for parameter extraction of mobility, threshold voltage, and contact resistance are provided. Approaches are elaborated for the essential practical feature of upgradability and reducibility of the TFT compact dc model, allowing for easier implementation and modification, as well as separation of characterization techniques.