Journal article
Finding the asymmetric parasitic source and drain resistances from the a.c. conductances of a single MOS transistor
Abstract
Layout asymmetry, processing, or hot-carrier stressing can give rise to unequal source and drain parasitic resistances in a MOSFET. In these cases, it is necessary to extract these resistances separately without the aid of other transistors. In this paper, we present a simple method to extract the source and drain parasitic resistances separately. This method, unlike earlier ones that depend on the measurements of the d.c. resistances of …
Authors
Raychaudhuri A; Deen MJ; King MIH; Kolk J
Journal
Solid-State Electronics, Vol. 39, No. 6, pp. 909–913
Publisher
Elsevier
Publication Date
June 1996
DOI
10.1016/0038-1101(95)00269-3
ISSN
0038-1101